FORECASTING THE SERVICE LIFE OF NANOSCALE PRODUCTS WITH COMPUTING EXPERIMENT METHODS
The paper deals with the methodology of forecasting the service life of nanoscale products based on the analysis of the kinetics of physical chemical processes which cause the product degradation. The resistive element serves as an example to show that it is feasible to define characteristic measures of the activation model of the functional parameter drift on the basis of computer modeling. The results obtained are crucial to choose the modes when conducting accelerated tests of microprocessing control systems adequate to their design operation modes.