Mechanisms of the loss of the quality of functioning of electronic technical devices depending on the level of their loading
The mechanisms of the breach of operating quality of the electronic technical devices under impact of disturbance electric signal are discussed. These mechanisms are adequately connected with the working regimes of active elements of the electric circuits, which forming electronic scheme of technical device. The working regimes of elements can be linear and non-linear, non-inertial and inertial, Its electric and heat strength is limited. In accordance with this, the result of impact of disturbance signal is flashover and permanent damage of functional of electronic technical device: disturbance, blocking of gain coefficient, functional malfunction, flashover failure, parametric malfunction and parametric failure as a result of the partial electric breakdowns of the semiconductor structures of active elements, catastrophic failure as a result of the thermal breakdown of the structures.