RAMAN STUDIES OF PHASE AND ATOMIC COMPOSITIONS OF GESI NANOSYSTEMS AFTER FEMTOSECOND PULSED ANNEALING
The phase and elemental compositions of GeSi heterostructures deposited on non-refractory substrates are analyzed by using a non-destructive express technique, i.e., the Raman spectroscopy. It is shown that application of pulsed laser annealing allows one to vary the elemental composition and size of nanocrystals formed from solid alloys of germanium and silicon.