DATA SAFETY IN HEAT-DAMAGED FLASH DRIVES
The article provides a brief overview of research on the preservation of information in heat-damaged digital media using flash memory. This information illustrates the trend of changing the lifetime of digital data as a function of temperature. Thus, experimental data from [2] showed that the information stored on the SIM card at the height of the table, after exposure to a temperature of 540°C, has a lifetime of about 20 minutes. The Arrhenius equation (2) is used to determine the lifetime of information on a digital medium. In another study [5], it was found that when exposed to a temperature of 650°C, the SIM-type smart card chip was subjected to thermal and mechanical destruction, which made it impossible to extract digital data. If the SIM card chips were exposed to lower temperatures, the information was extracted. However, as the authors note, due to possible differences in the electronic architecture of SIM cards from different manufacturers, the dependence of the lifetime of digital data on the value of the affected temperature may be different. Such research conducted with memory cards and other devices using flash memory would allow us to complete both the General picture in forensic methods of recovering digital data from heat-damaged flash drives, and to develop specific methods that take into account the electronic architecture and materials of digital media, the threshold values of temperature exposure and its time.