Calculation of parameters of a multilayered structure at the surface plasmon resonance
The evaluation method of reflectivity dependence resonance curve in the conditions of excitation surface plasmon resonance (SPR) for multilayered structure is presented. Experimental multilayer structures of SiC and SiO<sub>2 </sub>were obtained by vacuum magnetron sputtering for suggested method verification. Experimental and calculation data comparison has shown the good consent in the gained effects. Excited surface electromagnetic waves (SEW) are spread in narrow surface layer and have a wide scientific application: in examinations of semiconductor and metal surfaces, in investigation of transitive, adsorptive and oxide layers, and also in the every possible physical and chemical processes proceeding in different surfaces. Evaluations fields of applicability of the viewed methods are shown.