Phase Analysis of Electrodeposited Cu-Zn-Sn Precursors for Solar Cells Based Cu<sub>2</sub>ZnSnSe<sub>4</sub>
Cu-Zn-Sn (CZТ) precursors films on the substrates of Mo and Ta foil were electrochemically deposited. X-ray diffraction analysis was used to determine the phase composition of the as-deposited precursors films. It has been determined that in both cases as-deposited CZT films contains the following phases: -Cu<sub>5</sub>Zn<sub>8</sub>, -CuZn<sub>5</sub>, Cu, Sn and Zn.The hexagonal -Cu<sub>6.26</sub>Sn<sub>5</sub> phase was detected in CZT precursor deposited on the Ta substrate.