Technometric Identification of Integrated Circuits for Controlling Life Cycle and Counterfeit Detection
We considered the possibility of controlling and identifying chips and other electronic products. In particular, we propose an approach of identification based on measurements of analog characteristics of the product considered as a "black box". To build the system the instrument of biometrics and physically uncloneable functions is used. We get a set of properties those an identification system should possess, so we can talk about the technometry of integrated circuits. In relation to our approach, the classical biometric problem takes the following form: technometric verification (search for counterfeit, which means one-to-one comparison with the template) and identification (life cycle monitoring, which means one-to-many comparison, when after the "capture" of technometric data, a database connection is established to define the object). It has been shown on practice that the measurements of s-parameters allows identifying the chip and simultaneously solving the problem of identification and definition of authentic chips.