Control system and autonomous data logging during testing
Developed is an universal system control parameters of electronic components photodetectors during testing. With its help, it is possible to perform continuous tests with automatic registration and preservation of the measurement parameters via configurable intervals. Universality is achieved by the presence of ADC and DAC, as well as built-in switch signals. Examples of objects under study are considered. The construction of the control system parameters and methods to ensure the required characteristics have been described.