Comprehensive study of quality sapphire optical window modern nondestructive methods
Sapphire is a unique material that is widely used in modern instruments, as in the production of optical devices and microelectronics. Therefore, measurement of internal stress and the quality of polishing of detail’s surfaces of sapphire is an urgent problem in the scientific instrument. It is known that the geometry of the front of the radiation can affect the quality of polishing, and internal mechanical stresses associated with growing sapphire crystals. The goal of the work was to develop a highly sensitive method of nondestructive testing of the laser sapphire window and the link between the distribution of internal mechanical stresses nanoroughness with polished surfaces. Comprehensive studies have been conducted: the quality of polishing using atomic force microscopy, and the internal stresses - a new non-destructive polarization-modulation method. First established proportional relationship of internal stresses in laser sapphire windows and their nanoroughness of polished surfaces. The practical value lies in the development of new highly sensitive non-destructive polarization-modulation method by which control is performed tension-and micro-and nanodefect in crystalline materials that can be used in production.