Layer Structure of Surface of Microchannel Plates and Excitation of X-Ray Fluorescence in the Hole Microcapillaries
The surfaces of microchannel plates were investigated using a laboratory spectrometer for microfluorescence analysis and a source of synchrotron radiation. The using of mathematical statistics made it possible to estimate a degree of homogeneity and to compare chemical compositions of the surfaces of different samples of microchannel plates. The conditions under which the synchrotron radiation beam excited X-ray fluorescence propagating inside hollow microchannels were determined. For the energy corresponding to the region of anomalous dispersion near the SiL<sub>2,3</sub> absorption edges, X-ray diffraction and the spatial distribution of X-ray fluorescence at the exit of the microchannel plates were experimentally and theoretically studied. In a long-wavelength X-ray range, a relationship between elemental composition of the microchannel plate surface and angular distribution of synchrotron radiation transmitted through microcapillaries was studied.