MULTIVALUED SIMULATION OF CROSSTALK INDUCED PULSES FAULTS
It is considered the problem of simulation and test diagnosis of crosstalk induced pulses faults for combinational digital devices. There was developed a method of multivalued logic simulation in alphabet C <sub>9</sub>, which allows to simulate circuits with “induced impulses” faults. It was shown the efficiency of a multi-valued logic simulation in conjunction with the evolutionary approach to the problem of test generation for this type of faults.