Research of Catastrophic Failures in the CCD under the Impact of Heavy-Charged Particles
The results of CCD studies on resistance to single event effects (SEE) of failures are presented. The tests were carried out at normal and elevated supply voltages, also at normal and elevated body temperatures. We tried to suppress the effect by adding a resistor to the circuit. The use of a highspeed system of parrying excess current surges in the consumption current allowed to prevent the development of irreversible failure and to study and classify the observed SEE in detail. The parry system was developed by us earlier and has program control. The characteristic temperature dependence allowed us to state that the observed single failure effects are secondary breakdown or single event snapback (SES).