Stress States of Epitaxial Films with Structure of Garnet Ferrites
In this paper the X-ray diffraction analysis was used to study the difference in the sizes of the unit cells of the film and the substrate, as a result of which mismatch dislocations can form in the film structure. The method of approximation of diffraction lines, by broadening the peaks, established the values of II-type microstresses and the mosaic structure of ferrite-garnet films.