Analysis of noise in a model of a distributed fiber-optic temperature sensor based on Raman scattering
In this paper, it is shown that the noise of the photodetector device (PD) is the dominant factor limiting the metrological characteristics in real distributed fiber-optic temperature sensors based on Raman scattering (RDTS), which contribute significantly to the process of signal noise using the example of the RDTS taking into account the noise of the PD, which was chosen as the avalanche photodiode (APD). The analysis of the main types of noise in the model of an APD in the model, including both basic PD noise, and characteristic for APDs, for example, their influence on the signal-to-noise ratio (SNR). The graphs of the dependence of the influence of noise on the RDTS, derived from the SNR ratio, are given and conclusions are drawn about the predominance of some noise over others under different conditions, based on their.