Tests of non-failure operation for multi-row and array photodetectors on the basis of CdHgTe photodiodes
Results of tests for non-failure operation of three groups of multi-row and array photodetector devices such as the 4x288 multi-row FUK5M and the 384x288 array FUK6M, which are intended for registration of 8-12 μm thermal images, are described.