Crystallographic analysis of the CdHgTe heteroepitaxial structures
Crystallographic analysis of CdHgTe heteroepitaxial structures was carried out by high effective methods including high-resolution microscopy, X-ray diffractometry, mass spectrometry, and energy dispersive X-ray spectroscopy. Energy dispersive X-ray analysis is used as an analytical technique for the elemental analysis or chemical characterization within V-defect. The x-ray diffraction pattern was consists of one broad peak centered at q value of 47.25 <sup>о</sup>. X-ray diffraction pattern of CdHgTe consists of multiple peaks with overlapping. Half-width of rocking curve was of 74˝.