RESISTANCE OF PROMISING TECHNICAL MEANS OF INFORMATION PROCESSING BASED ON NANOSTRUCTURAL ELEMENTS TO EXTERNAL ELECTROMAGNETIC INFLUENCE
The paper presents summarized date by the values of the resistance of technical means of information processing (TMIP) in relation to powerful electromagnetic influence. Predictive estimates are given for the resistance of promising TMIP using a promising nano electronic component base. It is shown that the use of one electronic nano elements can lead to a significant decrease in the electromagnetic stability of promising TMIP, compared to an element with elements built on the basis of modern micro and nano dimensional electronic base.